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Damage thresholds of (ZrO_2–Y_2O_3)/SiO_2 reflectors used for XeCl lasers

✍ Scribed by Gu, Peifu ;Liu, Xu ;Tang, Jinfa

Book ID
115342667
Publisher
The Optical Society
Year
1993
Tongue
English
Weight
391 KB
Volume
32
Category
Article
ISSN
1559-128X

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TiO 2 single layers and TiO 2 /SiO 2 high reflectors (HR) are prepared by electron beam evaporation at different TiO 2 deposition rates. It is found that the changes of properties of TiO 2 films with the increase of rate, such as the increase of refractive index and extinction coefficient and the de