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Damage production in Si by MeV carbon cluster irradiation

✍ Scribed by M. Döbeli; R.M. Ender; U.S. Fischer; M. Suter; H.A. Synal; D. Vetterli

Book ID
113285463
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
700 KB
Volume
94
Category
Article
ISSN
0168-583X

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Carbon cluster ions C þ n (n = 1-5) and Cl + , Ti + , Ni + ions were used to bombard polycarbonate (PC) films. By comparing the electronic energy loss and the number of chromophores at a fixed wavelength, we obtained the electronic energy loss S e of carbon cluster ions in PC.