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Damage induced in semiconductors by swift heavy ion irradiation

✍ Scribed by M. Levalois; P. Marie

Book ID
114171308
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
139 KB
Volume
156
Category
Article
ISSN
0168-583X

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X-ray diffraction study of damage induce
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X-ray powder and high-resolution single-crystal diffraction techniques were used to study the irradiation damage of fluorapatites. Krypton, iodine and carbon irradiations were performed at high energy (%1 MeV/a) in the 10 11 to 5 β€’ 10 13 cm Γ€2 fluence range. Both diffraction techniques showed a stro