๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Damage analysis of 2D C/SiC composites subjected to thermal cycling in oxidizing environments by mechanical and electrical characterization

โœ Scribed by Hui Mei; Laifei Cheng


Book ID
116730821
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
290 KB
Volume
59
Category
Article
ISSN
0167-577X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES