✦ LIBER ✦
Damage Analysis and Atom Site Determination in Ion-Implanted GaAs Using Low Energy Proton Channeling and PIXE
✍ Scribed by Pronko, P. P.; Bhattacharya, R. S.
- Book ID
- 114662761
- Publisher
- IEEE
- Year
- 1983
- Tongue
- English
- Weight
- 775 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0018-9499
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