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D. Sayre, M. Howells, J. Kirz, M. Rarback (eds). X-Ray microscopy II. Springer Series in Optical Sciences, Vol. 56. Springer-Verlag, Berlin Heidelberg, New York, London, Paris, Tokyo 1988, 454 pages, 306 figures, DM 114,–, ISBN 3-540-19-392-8

✍ Scribed by E. Förster


Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
70 KB
Volume
24
Category
Article
ISSN
0232-1300

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