Cyclic X-Y mechanical tests: A new method to perform in situ reversed-deformation experiments in the high-voltage electron microscope
✍ Scribed by Kassner, Michael E. ;Sleeswyk, Andre W. ;Echer, Charles J.
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1987
- Tongue
- English
- Weight
- 824 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0741-0581
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✦ Synopsis
There has been, in the past, only limited success with in situ cyclic or reversed plastic deformation tests in the transmission electron microscope (TEM). This is probably partly due to problems associated with buckling of the foil when a n applied tensile or shear stress is reversed. Mechanical analysis shows that dislocation movement can be reversed by tensile stressing in alternating perpendicular directions (i.e., 90" rotations of a tensile stress); thus buckling of the foil can be avoided. A design for performing such X-Y in situ TEM tests is presented, with observations that demonstrate its feasibility.