Cyclic fatigue crack growth from indentation flaw in silicon nitride: Influence of effective stress ratio

✍ Scribed by Choi, Guen; Horibe, Susumu; Kawabe, Yoshikuni

• Book ID: 122924340
• Publisher: Elsevier Science
• Year: 1994
• Weight: 470 KB
• Volume: 42
• Category: Article
• ISSN: 0956-7151
• DOI: 10.1016/0956-7151(94)90449-9