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CW technique for measurement of linewidth enhancement factor: application to 735-nm tensile-strained GaAsP quantum-well lasers

✍ Scribed by D. Rodriguez; L. Borruel; I. Esquivias; H. Wenzel; B. Sumpf; G. Erbert


Book ID
119801155
Publisher
IEEE
Year
2004
Tongue
English
Weight
97 KB
Volume
16
Category
Article
ISSN
1041-1135

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