Cut the testing time of digital circuits : J. S. Burrill. Electron. Des. 25, December (1972), p. 90

• Book ID: 103270655
• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 103 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90542-8