✦ LIBER ✦
Cu/Si interface fracture due to fatigue of copper film in nanometer scale
✍ Scribed by Takashi Sumigawa; Tadashi Murakami; Tetsuya Shishido; Takayuki Kitamura
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 615 KB
- Volume
- 527
- Category
- Article
- ISSN
- 0921-5093
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