✦ LIBER ✦

Current status of MCFC R&D program at NEDO

Book ID: 104275215
Publisher: Elsevier Science
Year: 2001
Weight: 192 KB
Volume: 42
Category: Article
ISSN: 0140-6701
DOI: 10.1016/s0140-6701(01)80363-5

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✦ Synopsis

06 Electrical power supply and utilization (scientifk, technical) X-ray photo electron spectroscopy, and Auger electron spectroscopy. The sputtered film was annealed at different temperatures.

This paper also presents the results obtained on the microstructure, chemistry and the thermal stability of the diffusion barrier layer. 00/00301

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