Current modulated light reflectance spectroscopy with submicron spatial resolution in semiconductor heterostructures

Photoreflectance spectroscopy with nanom

Photoreflectance spectroscopy with nanometer spatial resolution under lateral current flow conditions in selectively doped heterostructures

✍ Lonskaya, E. ;Ryabushkin, O. 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 985 KB

## Abstract The simultaneous measurements of the photoreflectance spectra and __I__ –__V__ characteristics in GaAs/AlGaAs HEMT‐like structures allowed to determine the built‐in electric fields and a spatial dependence of the current density in direction transverse to heterostructure layers with nan