𝔖 Bobbio Scriptorium

✦ LIBER ✦

Current lines and accurate contact current evaluation in 2-D numerical simulation of semiconductor devices

✍ Scribed by Palm, E.; Van de Wiele, F.

Book ID: 114595296
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 930 KB
Volume: 32
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1985.22238

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