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Current instability in GaAs n+-i-n+ structures as a limitation of the maximum drain voltage of power MESFETs

✍ Scribed by V.A. Vashchenko; J.B. Martynov; V.F. Sinkevitch; A.S. Tager


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
468 KB
Volume
39
Category
Article
ISSN
0038-1101

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