Current-induced switching of exchange bias in nano-scaled magnetic tunnel junctions with a synthetic antiferromagnetic pinned layer

✍ Scribed by Chao, C. T.; Kuo, C. Y.; Horng, Lance; Tsunoda, M.; Takahashi, M.; Wu, J. C.

• Book ID: 111933236
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 533 KB
• Volume: 111
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3673811