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Current-induced surface dislocations on thin gold films

✍ Scribed by N Shimoni; O Biham; O Millo


Book ID
117218683
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
612 KB
Volume
414
Category
Article
ISSN
0039-6028

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A central question regarding thin metallic films is how does the roughness of the film affect its electrical transport properties, when its thickness is comparable to or smaller than the electron mean free path. The drive to build ever-faster circuits generates the drive for miniaturization and VLSI