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Current-Induced Critical State in NbN Thin-Film Structures

✍ Scribed by K. Il’in; M. Siegel; A. Engel; H. Bartolf; A. Schilling; A. Semenov; H.-W. Huebers


Book ID
106418430
Publisher
Springer US
Year
2008
Tongue
English
Weight
283 KB
Volume
151
Category
Article
ISSN
0022-2291

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