Current and resistivity dependence of electromigration from a statistical analysis of metallization failure data: S. J. Chua. Solid-St. Electron. 24, 173 (1981)

• Book ID: 107829279
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 122 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90267-5