✦ LIBER ✦
Current-acceleration for rapid time-to-failure determination of bipolar junction transistors under emitter-base reverse-bias stress
✍ Scribed by Neugroschel, A.; Chih-Tang Sah; Carroll, M.S.
- Book ID
- 114536125
- Publisher
- IEEE
- Year
- 1995
- Tongue
- English
- Weight
- 474 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0018-9383
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