Interfacial stability and grain diameter
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Dr. rer. nat. Jörg Vetter; Dr. rer. nat. Günther Schmidt; Dr. Ing. Joachim Früha
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Article
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1985
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John Wiley and Sons
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English
⚖ 438 KB
The Inor1)liolog-y of t h e solid-liquid interface antl t h e nietal phase grain tlianieter of A--Sit y p e eutectics (At-Si, Ag-Si, Ag-Ge, Zn-Ge) were investigated i n t h e range of a growth r a t e A' = 0.2 ... 20 mm/h antl of a temperature gradient a t t h e solid-liquid interfact: G = = 2 ... 2