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Crystallographic characterization of epitaxial Pb(Zr,Ti)O3 films with different Zr/Ti ratio grown by radio-frequency-magnetron sputtering

✍ Scribed by Kanno, Isaku; Kotera, Hidetoshi; Wasa, Kiyotaka; Matsunaga, Toshiyuki; Kamada, Takeshi; Takayama, Ryouichi

Book ID: 118141051
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 367 KB
Volume: 93
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1558951

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