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Crystallization study of poly(ether ether ketone)/poly(ether imide) blends by real-time small-angle x-ray scattering

โœ Scribed by Hsiao, Benjamin; Verma, Ravi; Sauer, Bryan


Book ID
120416852
Publisher
Taylor and Francis Group
Year
1998
Tongue
English
Weight
611 KB
Volume
37
Category
Article
ISSN
0022-2348

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Crystalline morphology in the blends of poly(ether ether ketone) (PEEK) and poly (ether imide) (PEI) was investigated by small-angle X-ray scattering. The lamellar thickness was found to be constant (~ 6 nm, independent of blend composition). The long period in 80/20 PEEK/PEI blend was greater than