Values of resistivity, temperature coefficient of resistance and Hall coefficient for a series of amorphous (Ti0.76Ni0.24)l \_xAlx cocondensed thin films over a large range of values for x and for a series of amorphous (Ti0.sCu0.5)l -xAlx melt-spun ribbons for values of x below 0.15 are reported. Va
β¦ LIBER β¦
Crystallization and stability of pseudo-binary amorphous transition metal-simple metal alloys
β Scribed by R. Pan; C.C. Hays; D.G. Naugle; K. Rhie
- Book ID
- 108025498
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 240 KB
- Volume
- 133
- Category
- Article
- ISSN
- 0921-5093
No coin nor oath required. For personal study only.
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