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Crystallinity studies of GaN/Si films grown at different temperatures by infrared reflectance spectroscopy

✍ Scribed by S.S. Ng; Z. Hassan; M.R. Hashim; M.E. Kordesch

Book ID: 113781179
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 238 KB
Volume: 91
Category: Article
ISSN: 0254-0584
DOI: 10.1016/j.matchemphys.2004.11.047

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