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Crystal Structure of La 4 Si 2 O 7 N 2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data

✍ Scribed by Takahashi, Junichi; Yamane, Hisanori; Hirosaki, Naoto; Yamamoto, Yoshinobu; Suehiro, Takayuki; Kamiyama, Takashi; Shimada, Masahiko

Book ID: 126827131
Publisher: American Chemical Society
Year: 2003
Tongue: English
Weight: 180 KB
Volume: 15
Category: Article
ISSN: 0897-4756
DOI: 10.1021/cm020930c

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