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Crosstalk model and estimation formula for VLSI interconnect wires

✍ Scribed by Liu Ling-zhi; Gong Shu; Rong Meng-tian


Book ID
105653406
Publisher
Wuhan University
Year
2002
Tongue
English
Weight
334 KB
Volume
7
Category
Article
ISSN
1007-1202

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## Abstract A new analytic model is presented (the model is based on the induced current density distribution inside silicon substrate) to calculate the frequency‐dependent distributed inductance and the associated distributed series resistance of silicon semiconducting VLSI interconnects. The vali