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Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies

✍ Scribed by Balasubramanian, A.; Sternberg, A. L.; Bhuva, B. L.; Massengill, L. W.

Book ID: 120214781
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 735 KB
Volume: 53
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2006.884675

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