Cross-sectional TEM study of the microstructure of superconducting X-ray detectors based on thin W–Al layers

✍ Scribed by G Sáfrán; M Loidl; O Meier; W Seidel; F Pröbst

• Book ID: 114165624
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 226 KB
• Volume: 192
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(02)00482-2