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Cross-sectional scanning tunneling microscopy of MBE-grown Si p-n junctions and Si/SiGe superlattices

✍ Scribed by E.T. Yu; M.B. Johnson; V.P. Kesan; A.R. Powell; J.-M. Halbout; S.S. Iyer

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 394 KB
Volume: 127
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(93)90655-g

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