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Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes

✍ Scribed by Ankudinov, A. V.; Titkov, A. N.; Shubina, T. V.; Ivanov, S. V.; Kopâev, P. S.; Lugauer, H.-J.; Reuscher, G.; Keim, M.; Waag, A.; Landwehr, G.

Book ID: 119996651
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 685 KB
Volume: 75
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.125099

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