Critical shear stress produced by interaction of edge dislocation with nanoscale inhomogeneity

✍ Scribed by Q. H. Fang; J. M. Chen; Y. W. Liu; P. H. Wen

• Book ID: 107582297
• Publisher: Springer-Verlag
• Year: 2010
• Tongue: English
• Weight: 530 KB
• Volume: 33
• Category: Article
• ISSN: 0250-4707
• DOI: 10.1007/s12034-010-0017-9