𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Critical relationships between particle size, composition, and microstructure in thick-film resistors : Sanjay M. Chitale and Robert W. Vest. IEEE Trans. Comp. Hybrids Manufact. Tech. 11(4), 604 (December 1988)


Book ID
103282860
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
129 KB
Volume
30
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.