The critical heat flux, q, has been measured on narrow tin films. The data on relating q to film width and temperature have been found. It has been observed that as a film width decreases, q increases appreciably. The critical heat flux value for narrow films (w = 4#) is several times more than that
Critical heat flux on a flat plate in pressurized He II
โ Scribed by H. Tatsumoto; K. Hata; K. Hama; Y. Shirai; M. Shiotsu
- Publisher
- Elsevier Science
- Year
- 2001
- Tongue
- English
- Weight
- 131 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0011-2275
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โฆ Synopsis
The critical heat ยฏuxes (CHFs) were measured on three horizontal ยฏat plates of the same width of 10.5 mm and with lengths of 10, 15.6, and 40 mm in subcooled He II with the temperature of 1.8, 1.9 and 2.0 at atmospheric pressure. The ยฏat plates were made of Manganin, one side of which was thermally insulated. The measured CHFs were higher for shorter length of the test plate and for lower liquid temperature. The correlation for CHFs on ยฏat plates in He II already presented by the authors was conยฎrmed to describe CHFs on various sized ยฏat plates including square ones within 20% dierence.
๐ SIMILAR VOLUMES
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