Critical Ge concentration for 2×n reconstruction appearing on GeSi covered Si(100)

✍ Scribed by L.W Guo; Q Huang; Y.K Li; S.L Ma; C.S Peng; J.M Zhou

• Book ID: 117218521
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 247 KB
• Volume: 406
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(98)00234-9