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Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h

✍ Scribed by Xiao-Fen Li; Jean-Claude Grivel; Asger B. Abrahamsen; Niels H. Andersen

Book ID: 113850748
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 628 KB
Volume: 477
Category: Article
ISSN: 0921-4534
DOI: 10.1016/j.physc.2012.02.032

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