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Critical Current Density and Temperature Dependence of Nb-Al Oxide-Nb Junction Resistance and Implications for Room Temperature Characterization

✍ Scribed by Kleinsasser, A.; Chui, T.; Bumble, B.; Ladizinsky, E.

Book ID: 118174746
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 577 KB
Volume: 23
Category: Article
ISSN: 1051-8223
DOI: 10.1109/tasc.2012.2228731

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