Critical current density across 45° misoriented grain boundaries in YBCO thin films

✍ Scribed by H.S. Kwok; D.H. Kim

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 193 KB
• Volume: 185-189
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(91)91270-e

✦ Synopsis

The question of critical current reduction across 45 ° misoriented grain boundaries was addressed in this study. The reduction in Jc for a polycrystalline c-axis perpendicular film with complete and partial in plane a-axis texturing was calculated using a limiting-pathe model. The numerical results were then compared to experimental results obtained with YBCO on YSZ substrates, which had a particular texturing that is most suited for this study. The results indicated that the Jc reduction was not so large as indicated in the bicrystal studies of Dimos et al.

Most electronic applications of high Tc materials are based on the availability of good quality thin films.

It is well-known that even the best YBCO films are polycrystalline with grain sizes of 0.05-0.5/zm. For a c-