Critical current behavior in narrow YBa2Cu3O7−δ thin films

✍ Scribed by Shuichi Tahara; S.M. Anlage; Chang-Boem Eom; D.K. Fork; T.H. Geballe; M.R. Beasley

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 139 KB
• Volume: 162-164
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(89)90640-0

✦ Synopsis

Critical current measurements are reported for narrow strips ( down to -1.0 gm) of YBa2Cu 3 07_ 8 thin films deposited and lithographically patterned by various means. A systematic increase in Uae critical current aensities is observed in tile narrowest strips, suggesting the possible presence of edge pinning in these films. The critical currents are found to be near ~he depairing limit for these particular films. The critical currents are found to decrease with increasing temperature near zero temperature as in the flux creep formula of Tinkham. The pinning energy derived in the flux creep regime of a 6 Inn wide strip is found to oe approximately 100 meV.