Critical current angle-dependent measurements of thin (15nm) chemically-derived YBa2Cu3O7−d films in fields to 5.5 T
✍ Scribed by D.H. Liebenberg; P.C. Mclntyre; M.J. Cima; T.L. Francavilla
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 136 KB
- Volume
- 235-240
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
Critical current measurements were made using films of YBa2Cu307. d prepared by a metalorganic process. The film thickness was purposely reduced to about 15 nm so that measurements of the critical current could be made at temperatures of 4.2 K with reasonable width. Magnetic fields to 5.53 T were applied parallel to the film plane and as a function of angle from that plane. The current and applied field were always orthogonal. Comparison with measurements at 77 K show that at low fields, 0.5 T, the peak in critical current near H//a,b is broadened at the lower temperature. Increasing fields tend to sharpen the peak more rapidly at 4 K. Measurements with H//c show a decrease by a factor of 4 at 5.5 T and did not change during a second thermal cycle between room temperature and 4.2 K. The power law exponents were determined from the I-V data ranging from 1-1501xV.