Critical behavior of a filling-controlled Mott-transition observed at an organic field-effect-transistor interface

✍ Scribed by H. M. Yamamoto, J. Ueno, R. Kato

• Book ID: 120949530
• Publisher: Springer-Verlag
• Year: 2013
• Tongue: English
• Weight: 516 KB
• Volume: 222
• Category: Article
• ISSN: 1951-6355
• DOI: 10.1140/epjst/e2013-01906-0