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Critical assessment of thickness-dependent conductivity of thin metal films

✍ Scribed by Horst Hoffmann; J. Vancea

Book ID: 107864026
Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 936 KB
Volume: 85
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(81)90627-1

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