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Critical angle for light ions registered in a CR-39 SSNTD: Variations with energy, etching conditions and etching time

✍ Scribed by F. Membrey; M. Fromm; A. El Rahamany; A. Chambaudet


Publisher
Elsevier Science
Year
1993
Weight
535 KB
Volume
21
Category
Article
ISSN
0969-8078

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