Crack tip stress fields revealed by infrared photoelasticity in silicon crystals
โ Scribed by Kenji Higashida; Masaki Tanaka; Ena Matsunaga; Hironori Hayashi
- Book ID
- 103839366
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 279 KB
- Volume
- 387-389
- Category
- Article
- ISSN
- 0921-5093
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๐ SIMILAR VOLUMES
For a crack in an elastic-perfectly plastic crystal, there exist more than one asymptotic stress field around the crack tip. The condition governing which field occurs cannot be determined by the asymptotic fields, but depends on external loading conditions. For a plane-strain tensile crack in the (
Factors which influence crack tip stress field data are identified as: (1) Non-linear zone near crack tip due to crack blunting. (2) Normal stress parallel to crack surface. (3) Location of region for data retrieval. The Kolosoff-Inglis solution is used in order to assess effects of crack tip blunti