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Coverage-dependent Bond Length of Chlorine Adsorbed on Cu{111}

โœ Scribed by Way, W. K.; Pike, A. C.; Rosencrance, S. W.; Braun, R. M.; Winograd, N.


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
515 KB
Volume
24
Category
Article
ISSN
0142-2421

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โœฆ Synopsis


The adsorption of CI, on Cu{lll} at 300 K has been studied using shadow-cone-enhanced secondary ion mass spectrometry (SIMS). The system has been investigated for chlorine coverages ranging from 0.08 to 0.33 monolayer (ML), including the Cu{lll}-(J3 x J3)R3O0-CI surface. The secondary Cu* ion intensity has been measured as a function of the incidence angle of the primary ion beam. The enhanced intensity features in the spectra are compared with results from a two-body interaction calculation that uses the Moliere approximation to the ThomasFermi potential. A chlorine-copper interlayer spacing of 1.87 f 0.04 is measured between the coverages of 0.17 and 0.33 ML. This value corresponds to a chlorinoe-copper bond length of 2.38 f 0.04 A. At 0.08 ML, the chlorine-copper bond length is expanded to 2.48 f 0.04 A. These results suggest that the chlorine-copper bond is more ionic in the low coverage limit.


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