Course 22: Semiconductors, Proceedings o
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J.C. Hensel
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Article
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1964
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Elsevier Science
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English
⚖ 90 KB
The complementary chapter "Modern Methods in Surface Kinetics" by G. Ehrlich, presents a detailed exposition of flash desorption, electron microscopy, field ion microscopy and various ultrahigh vacuum techniques. These techniques have been used to confirm or refute previo~m mechanism proposals. Exce