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Cosmic-ray soft error rate characterization of a standard 0.6-/spl mu/m CMOS process
✍ Scribed by Hazucha, P.; Svensson, C.; Wender, S.A.
- Book ID
- 119775664
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 418 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0018-9200
- DOI
- 10.1109/4.871318
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