✦ LIBER ✦
Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-Up in CMOS Memories
✍ Scribed by Stephen, J H; Sanderson, T K; Mapper, D; Farren, J; Harboe-Sorensen, R; Adams, L
- Book ID
- 114662897
- Publisher
- IEEE
- Year
- 1983
- Tongue
- English
- Weight
- 980 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0018-9499
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