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Corrigendum to “Ta–Rh binary alloys as a potential diffusion barrier between Cu and Si: Stability and failure mechanism of the Ta–Rh amorphous structures” [Acta Mater. 61 (2013) 5365–5374]

✍ Scribed by Dalili, Neda; Liu, Qi; Ivey, Douglas G.


Book ID
122035294
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
143 KB
Volume
62
Category
Article
ISSN
1359-6454

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