Corrigendum to “Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering” [Mater. Res. Bull. 48 (2013) 1093–1098]

✍ Scribed by Singh, Jai; Zhang, X.L.; Hui, K.S.; Hui, K.N.

• Book ID: 123237524
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 77 KB
• Volume: 48
• Category: Article
• ISSN: 0025-5408
• DOI: 10.1016/j.materresbull.2013.02.001